dice/dwf specification 1 RH1573K information furnished by linear technology corporation is believed to be accurate and reliable. however, no responsibility is assumed for its use. linear technology corporation makes no representa- tion that the interconnection of its circuits as described herein will not infringe on existing patent rights. 1 2 3 4 5 9 8 7 6 l , lt, ltc and ltm are registered trademarks of linear technology corporation. all other trademarks are the property of their respective owners. pad function 1. 2. 3. 4. 5. 6. 7. 8. 9. drive v in v out comp gnd1** fb latch shdn gnd2** **gnd1 and gnd2 are connected together to form gnd 61mils 72mils, 12mils thick. ? backside metal: alloyed gold layer (k designator) backside potential: lowest (gnd) voltage die cross reference ltc finished part number order part number RH1573K ? RH1573K ? RH1573Kdice ? RH1573Kdwf* , ? please refer to ltc standard product data sheet for other applicable product information. *dwf = dice in wafer form. low dropout pnp regulator driver dice/dwf electrical test limits t a = 25c. parameter conditions min max units reference voltage i drive = 20ma, t j = 25c 1.252 1.278 v line regulation (v fb )i drive = 20ma, 3v < v in < 7v 2 mv load regulation (v fb )i drive = 20ma to 250ma 18 mv fb pin bias current v fb = 1.265v 4 a drive pin current v fb = 1.35v, v drive = 7v v fb = 1.15v, v drive = 1.5v 290 1.2 ma ma drive pin saturation voltage i drive = 20ma, v fb = 1.15v i drive = 250ma, v fb = 1.15v 0.2 1 v v
dice/dwf specification 2 RH1573K linear technology corporation 1630 mccarthy blvd., milpitas, ca 95035-7417 (408) 432-1900 fax: (408) 434-0507 www.linear.com ? linear technology corporation 2008 lt 0808 ? printed in usa wafer level testing is performed per the indicated speci? cations for dice. considerable differences in performance can often b e observed for dice versus packaged units due to the in? uences of packaging and assembly on certain devices and/or parameters. please consult factory for more information on dice performance and lot quali? cations via lot sampling test procedures. dice data sheet subject to change. please consult factory for current revision in production. i.d.no. 66-13-rh1573 dice/dwf electrical test limits t a = 25c. parameter conditions min max units shdn pin threshold voltage 1 1.5 v shdn pin current v shdn = 5v 300 a latch pin latch-off threshold voltage 1.1 1.8 v latch pin charging current 4 10 a latch pin latching current 0.85 ma v in to v out differential threshold for latch disable 0.55 0.8 v input quiescent current v in = 7v 2.8 ma minimum input voltage for bias operation 2.4 v note 1: for circuit operation and application information refer to lt1573 data sheet. note 2: for post radiation performance contact factory.
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